A novel in-situ calibration technique for a high resolution E-Field probe

Dehghan, N. and Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X 2015. A novel in-situ calibration technique for a high resolution E-Field probe. Presented at: 2015 IEEE MTT-S International Microwave Symposium, Phoenix, AZ, USA, 17-22 May 2015. 2015 IEEE MTT-S International Microwave Symposium. IEEE, pp. 1-3.

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Abstract

The potential of E-Field probes as diagnostic tools in operational microwave circuits and devices has been widely recognised but little used. Progress in this area has always been hampered by the lack of an absolute calibration technique. As such, these measurements are usually only useful for relative measurements over a range of electrical conditions where the probe remains stationary. This paper describes a probe design which can be calibrated in-situ each time the probe is moved. The calibration technique is demonstrated by measurements of RF waveforms at the device plane of a medium power (10W) GaAs PHEMT power amplifier.

Item Type:	Conference or Workshop Item (Paper)
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	IEEE
Last Modified:	01 Nov 2022 10:51
URI:	https://orca.cardiff.ac.uk/id/eprint/93056

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