Determining residual stress depth profiles using the magnetic Barkhausen effect

Mierczak, Lukasz P., Melikhov, Yevgen ORCID: https://orcid.org/0000-0002-9787-5238 and Jiles, David C. 2014. Determining residual stress depth profiles using the magnetic Barkhausen effect. IEEE Transactions on Magnetics 50 (10) , pp. 1-5. 10.1109/TMAG.2014.2329455

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Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Publisher:	Institute of Electrical and Electronics Engineers
ISSN:	0018-9464
Last Modified:	06 Jul 2023 02:22
URI:	https://orca.cardiff.ac.uk/id/eprint/93144

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