A novel microwave non contact current probe with high spatial resolution

Al-Ziayree, Ali Mahdi Lafta, Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X and Perks, Richard Marc ORCID: https://orcid.org/0000-0003-0873-0537 2016. A novel microwave non contact current probe with high spatial resolution. Presented at: 2016 IEEE MTT-S International Microwave Symposium (IMS), San Francisco, CA, USA, 22-27 May 2016. 2016 IEEE MTT-S International Microwave Symposium (IMS). IEEE Xplore. IEEE, pp. 1-3. 10.1109/MWSYM.2016.7540265

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Abstract

A high-resolution microwave non-contact current probe is described. Novel techniques are used in order to reduce the intrusive E-field pickup, which has restricted the performance and usefulness of such probes in the past. These include a probe structure that has built-in E-field screening and a high performance broadband differential amplifier. A rigorous testing procedure is described which asserts that the probe is truly responding almost entirely to the H-field. The probe operates up to 9GHz and has been used to profile the current distribution between the multiple cells of a power transistor at 3GHz, the first time such a direct measurement of this kind has been reported.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	IEEE
ISBN:	978-1-5090-0698-4
Last Modified:	02 Nov 2022 10:20
URI:	https://orca.cardiff.ac.uk/id/eprint/98313

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