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McGenn, William 2013. RF IV waveform engineering applied to VSWR sweeps and RF stress testing. PhD Thesis, Cardiff University.
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McGenn, William, Uren, Michael J., Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2012. Development of an RF IV waveform based stress test procedure for use on GaN HFETs. Microelectronics Reliability 52 (12) , pp. 2880-2883. 10.1016/j.microrel.2012.09.007

McGenn, William, Choi, Heungjae ORCID: https://orcid.org/0000-0003-1108-293X, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Uren, Michael J., Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2012. Development of a RF waveform stress test procedure for GaN HFETs subjected to infinite VSWR sweeps. Presented at: 2012 IEEE MTT-S International Microwave Symposium Digest, Montreal, Canada, 17-22 June 2012. Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International. IEEE, pp. 1-3. 10.1109/MWSYM.2012.6259725

Carrubba, Vincenzo, Clarke, Alan Leslie, Woodington, Simon P., McGenn, William, Akmal, Muhammad, Almuhaisen, Abdullah, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X, Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 and Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 2011. High-speed device characterization using an active load-pull system and waveform engineering postulator. Presented at: 2011 77th ARFTG Microwave Measurement Conference (ARFTG), Baltimore, MD, USA, 10 June 2011. Design and Measurement of Microwave Systems - Proceedings of the 2011 77th ARFTG Microwave Measurement Conference (ARFTG). Los Alamitos, CA: IEEE, 10.1109/ARFTG77.2011.6034553

McGenn, William, Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349, Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830, Powell, Jeffrey and Uren, Michael 2011. RF waveform investigation of VSWR sweeps on GaN HFETs. Presented at: 6th European Microwave Integrated Circuits Conference (EuMIC) 2011, Manchester, UK, 10-11 October 2011. Proceedings of the 6th European Microwave Integrated Circuits Conference (EuMIC). Los Alamitos, CA: IEEE, pp. 17-20.

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