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Peach, Tomas, Salmond, Ben, Jones, Tyrone, Beaumont, Elizabeth, Thomas, Stuart, Sobiesierski, Angela and Shutts, Samuel  ORCID: https://orcid.org/0000-0001-6751-7790
2025.
A hybrid electron beam lithography approach to wafer scale up of 150 mm InP ridge lasers.
IEEE Transactions on Semiconductor Manufacturing
38
(4)
, pp. 783-789.
10.1109/tsm.2025.3601735
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