Min, Gao ORCID: https://orcid.org/0000-0001-9591-5825 2010. ZT Measurement under large temperature differences. Journal of Electronic Materials 39 (9) , pp. 1782-1785. 10.1007/s11664-010-1136-1 |
Abstract
All current techniques for ZT measurement are carried out under a small temperature difference, despite the fact that thermoelectric devices are likely to operate under a relatively large temperature difference. In this paper, we describe a new technique which enables ZT measurement under a large temperature difference. The principle of measurement is presented, followed by a proof-of-concept study. The results of this study show that ZT values obtained under a large temperature difference differ significantly from those obtained under small temperature differences. The technique provides a more realistic evaluation of thermoelectric materials and devices.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Subjects: | T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) |
Uncontrolled Keywords: | Thermoelectric; electrical and thermal transport; energy materials |
Publisher: | Springer |
ISSN: | 0361-5235 |
Last Modified: | 17 Oct 2022 10:21 |
URI: | https://orca.cardiff.ac.uk/id/eprint/7797 |
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