Min, Gao ORCID: https://orcid.org/0000-0001-9591-5825
2010.
ZT Measurement under large temperature differences.
Journal of Electronic Materials
39
(9)
, pp. 1782-1785.
10.1007/s11664-010-1136-1
|
Abstract
All current techniques for ZT measurement are carried out under a small temperature difference, despite the fact that thermoelectric devices are likely to operate under a relatively large temperature difference. In this paper, we describe a new technique which enables ZT measurement under a large temperature difference. The principle of measurement is presented, followed by a proof-of-concept study. The results of this study show that ZT values obtained under a large temperature difference differ significantly from those obtained under small temperature differences. The technique provides a more realistic evaluation of thermoelectric materials and devices.
| Item Type: | Article |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Engineering |
| Subjects: | T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) |
| Uncontrolled Keywords: | Thermoelectric; electrical and thermal transport; energy materials |
| Publisher: | Springer |
| ISSN: | 0361-5235 |
| Last Modified: | 17 Oct 2022 10:21 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/7797 |
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