Interface state artefact in long gate-length AlGaN/GaN HEMTs

Waller, William M., Karboyan, Serge, Uren, Michael J., Lee, Kean Boon, Houston, Peter A., Wallis, David J. ORCID: https://orcid.org/0000-0002-0475-7583, Guiney, Ivor, Humphreys, Colin J. and Kuball, Martin 2015. Interface state artefact in long gate-length AlGaN/GaN HEMTs. IEEE Transactions of Electron Devices 62 (8) , pp. 2464-2469. 10.1109/TED.2015.2444911

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Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering
Publisher:	IEEE
ISSN:	0018-9383
Last Modified:	23 Oct 2022 13:02
URI:	https://orca.cardiff.ac.uk/id/eprint/109506

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