Interface state artefact in long gate-length AlGaN/GaN HEMTs

Waller, William M., Karboyan, Serge, Uren, Michael J., Lee, Kean Boon, Houston, Peter A., Wallis, David J., Guiney, Ivor, Humphreys, Colin J. and Kuball, Martin 2015. Interface state artefact in long gate-length AlGaN/GaN HEMTs. IEEE Transactions of Electron Devices 62 (8) , pp. 2464-2469. 10.1109/TED.2015.2444911

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Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering
Publisher:	IEEE
ISSN:	0018-9383
Last Modified:	11 Mar 2019 17:43
URI:	https://orca.cardiff.ac.uk/id/eprint/109506

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