Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy

Chen, Chen, Ghosh, Saptarsi, De Wolf, Peter, Liang, Zhida, Adams, Francesca, Kappers, Menno J., Wallis, David J. ORCID: https://orcid.org/0000-0002-0475-7583 and Oliver, Rachel A. 2024. Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy. Applied Physics Letters 124 (23) , 232107. 10.1063/5.0203646

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Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Publisher:	American Institute of Physics
ISSN:	0003-6951
Date of First Compliant Deposit:	4 June 2024
Date of Acceptance:	15 May 2024
Last Modified:	10 Jun 2024 08:52
URI:	https://orca.cardiff.ac.uk/id/eprint/169170

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