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Considerations on the XPS Analysis of 2H-TaS2 (0001)

Drivas, Charalampos ORCID: https://orcid.org/0000-0002-7865-1124, Catlow, C. Richard A. ORCID: https://orcid.org/0000-0002-1341-1541, Isaacs, Mark A. ORCID: https://orcid.org/0000-0002-0335-4272 and Georgios, Kyriakou ORCID: https://orcid.org/0000-0001-6295-844X 2025. Considerations on the XPS Analysis of 2H-TaS2 (0001). Surface and Interface Analysis 10.1002/sia.70013

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Abstract

A 2H-TaS2 (0001) single crystal was studied with XPS. The quantification and fitting procedures for this material are discussed in detail. It is shown that conventional approaches for data deconvolution fail, and an in-depth analysis utilising theoretical sensitivity factors and taking into account the shake-up and loss structures is needed to produce accurate results. Additionally, the inherent asymmetry of the Ta and S peaks is highlighted, and appropriate line shapes are determined.

Item Type: Article
Date Type: Published Online
Status: In Press
Schools: Schools > Chemistry
Subjects: Q Science > QC Physics
Q Science > QD Chemistry
Publisher: Wiley-Blackwell
ISSN: 0142-2421
Funders: Hellenic Foundation for Research and Innovation, Engineering and Physical Sciences Research Council
Date of First Compliant Deposit: 1 September 2025
Date of Acceptance: 18 August 2025
Last Modified: 01 Sep 2025 14:19
URI: https://orca.cardiff.ac.uk/id/eprint/180756

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