XPS insight note - strategies for obtaining peak shapes and inferring chemistry

Morgan, D. J. ORCID: https://orcid.org/0000-0002-6571-5731, Isaacs, M. A. ORCID: https://orcid.org/0000-0002-0335-4272 and Graf, A. 2025. XPS insight note - strategies for obtaining peak shapes and inferring chemistry. Surface and Interface Analysis 57 (10) , pp. 816-821. 10.1002/sia.70014

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Abstract

The chemical specificity of x‐ray photoelectron spectroscopy (XPS) for the analysis of surfaces is well established. However, overlapping peaks and complex peak shapes can hinder routine analysis of spectra. Studies involving controlled changes to samples to systematically change photoelectron spectra can reveal invaluable information on peak shapes and hidden spectral features. This insight note is presented to educate users in embracing and utilising changes in spectra to facilitate spectral analysis.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Chemistry
Additional Information:	License information from Publisher: LICENSE 1: URL: http://creativecommons.org/licenses/by/4.0/
Publisher:	Wiley
ISSN:	0142-2421
Date of First Compliant Deposit:	10 September 2025
Date of Acceptance:	29 August 2025
Last Modified:	10 Sep 2025 10:15
URI:	https://orca.cardiff.ac.uk/id/eprint/181036

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