Zurek, S., Marketos, Philip, Anderson, Philip Ian ORCID: https://orcid.org/0000-0001-6500-6583 and Moses, Anthony John
2006.
Influence of digital resolution of measuring equipment on the accuracy of power loss measured in Epstein frame.
Presented at: 9th International workshop on 1 & 2 Dimensional Magnetic Measurements and Testing,
Czestochowa, Poland,
p. 18.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Schools: | Schools > Engineering |
| Last Modified: | 19 Oct 2022 09:36 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/21620 |
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