Zurek, S., Marketos, Philip, Anderson, Philip Ian ORCID: https://orcid.org/0000-0001-6500-6583 and Moses, Anthony John 2006. Influence of digital resolution of measuring equipment on the accuracy of power loss measured in Epstein frame. Presented at: 9th International workshop on 1 & 2 Dimensional Magnetic Measurements and Testing, Czestochowa, Poland, p. 18. |
Item Type: | Conference or Workshop Item (Paper) |
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Schools: | Engineering |
Last Modified: | 19 Oct 2022 09:36 |
URI: | https://orca.cardiff.ac.uk/id/eprint/21620 |
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