A symmetric convexity measure

Rosin, Paul l. ORCID: https://orcid.org/0000-0002-4965-3884 and Mumford, Christine Lesley ORCID: https://orcid.org/0000-0002-4514-0272 2004. A symmetric convexity measure. Presented at: 17th International Conference on Pattern Recognition (ICPR 2004), Cambridge, UK, 23-26 August 2004. Published in: Kittler, Josef, Petrou, Maria and Nixon, Mark eds. Proceedings of the 17th International Conference on Pattern Recognition. PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 4. , vol.4 Piscataway, NJ: IEEE, pp. 11-14. 10.1109/ICPR.2004.1333693

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Abstract

A new area-based convexity measure for polygons is described. It has the desirable properties that it is not sensitive to small boundary defects, and it is symmetric with respect to intrusions and protrusions. The measure requires a maximally overlapping convex polygon, and this is efficiently estimated using a genetic algorithm. Examples of the measures application to medical image analysis are shown.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Computer Science & Informatics
Subjects:	Q Science > QA Mathematics > QA75 Electronic computers. Computer science Q Science > QA Mathematics > QA76 Computer software
Publisher:	IEEE
ISBN:	9780769521282
Last Modified:	07 Nov 2022 08:12
URI:	https://orca.cardiff.ac.uk/id/eprint/31267

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