Polarization response of quantum-confined structures using edge-photovoltage spectroscopy

Mexis, Meletios, Blood, Peter and Smowton, Peter Michael ORCID: https://orcid.org/0000-0002-9105-4842 2007. Polarization response of quantum-confined structures using edge-photovoltage spectroscopy. Semiconductor Science and Technology 22 (12) , pp. 1298-1301. 10.1088/0268-1242/22/12/010

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Abstract

We propose a method to obtain the ratio of the fundamental TE/TM optical response of a quantum-confined system from the measurement of the polarization dependence of the edge photovoltage spectrum by correcting for polarization-dependent features of the experimental system. When applied to compressive- and tensile-strained InGaP quantum well structures, the results are in excellent agreement with known ratios of the band-edge matrix elements. The method will be of a particular value in the study of quantum dot systems.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	Institute of Physics
ISSN:	0268-1242
Last Modified:	25 Oct 2022 08:30
URI:	https://orca.cardiff.ac.uk/id/eprint/53207

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