Shen, T. -H. and Matthai, Clarence Cherian 1991. The electronic structure of Si(100) and As/Si(100) surfaces. Journal of Physics: Condensed Matter 3 (32) , pp. 6169-6172. 10.1088/0953-8984/3/32/022 |
Official URL: http://dx.doi.org/10.1088/0953-8984/3/32/022
Abstract
The electronic structure of the arsenic terminated silicon (100) surface is calculated using the tight binding method in the extended Huckel approximation. The results are compared with the reconstructed silicon (100) surface, and the passivation of the silicon surface is discussed in context of the authors results.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Subjects: | Q Science > QC Physics |
Publisher: | IOP Publishing |
ISSN: | 0953-8984 |
Last Modified: | 04 Jun 2017 06:49 |
URI: | https://orca.cardiff.ac.uk/id/eprint/65070 |
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