Bass, J. M. and Matthai, Clarence Cherian 1991. Electronic structure of the Si6/(Si0.5Ge0.5)6 001 superlattices. Semiconductor Science and Technology 6 (2) , pp. 109-111. 10.1088/0268-1242/6/2/007 |
Official URL: http://dx.doi.org/10.1088/0268-1242/6/2/007
Abstract
Using ab initio pseudopotentials the authors calculated the electronic structure of the Si6/(Si0.5Ge0.5)6 superlattices strained to Si, Si0.75Ge0.25 and Si0.5Ge0.5 (001) orientated substrates. They found that none of these materials displays direct gaps. They also calculated the valence band offsets of the Si/Si0.5Ge0.5(001) interface for different strain configurations and found them not to be simply one half of those of the Si/Ge interface for the same strains.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Subjects: | Q Science > QC Physics |
Publisher: | Institute of Physics |
ISSN: | 0268-1242 |
Last Modified: | 04 Jun 2017 06:49 |
URI: | https://orca.cardiff.ac.uk/id/eprint/65075 |
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