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Number of items: 5.

Collier, Arthur, Eblabla, Abdalla ORCID: https://orcid.org/0000-0002-5991-892X, Sampson, Wesley ORCID: https://orcid.org/0000-0001-7670-0036, Yadollahifarsi, Elham, Hepp, Edgar, Conte, Ricardo and Elgaid, Khaled ORCID: https://orcid.org/0000-0003-3265-1097 2025. Metal additive micro-manufacturing to achieve enhanced air-bridge geometry for coplanar waveguide mm-wave GaN-on-SiC integrated circuits. Presented at: CS MANTECH, New Orleans, US, 18-21st May 2025.
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Eblabla, Abdalla ORCID: https://orcid.org/0000-0002-5991-892X, Sampson, Wesley ORCID: https://orcid.org/0000-0001-7670-0036, Bhat, Aasif Mohammad, Collier, Arthur, Yadollahifarsi, Elham and Elgaid, Khaled ORCID: https://orcid.org/0000-0003-3265-1097 2025. Dual-gate RF HEMT based on P-GaN/AlGaN on Si technology for future X-band on-chip RF and power electronics. Presented at: CS MANTECH, New Orleans, US, 18-21st May 2025.
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Collier, Arthur, Eblabla, Abdalla ORCID: https://orcid.org/0000-0002-5991-892X, Sampson, Wesley ORCID: https://orcid.org/0000-0001-7670-0036, Shepphard, Daniel, Harvey, Alan, Quaglia, Roberto ORCID: https://orcid.org/0000-0003-3228-301X and Elgaid, Khaled ORCID: https://orcid.org/0000-0003-3265-1097 2025. Large-signal performance comparison of ion implant and mesa etch isolated AlGaN/GaN HEMT switches on silicon. Presented at: European Microwave Integrated Circuits Conference, Utrecht, The Netherlands, 23 September 2025.
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Collier, Arthur 2024. Advancing GaN MMIC technology through fabrication technique enhancement. PhD Thesis, Cardiff University.
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Eblabla, Abdalla ORCID: https://orcid.org/0000-0002-5991-892X, Sampson, Wesley ORCID: https://orcid.org/0000-0001-7670-0036, Collier, Arthur and Elgaid, Khaled ORCID: https://orcid.org/0000-0003-3265-1097 2024. Free-standing lateral AlGaN/GaN Schottky Barrier Diode based-on GaN-on-Si technology for high microwave power applications. Presented at: 19th European Microwave Integrated Circuits Conference (EuMIC), Paris, France, 23-24 September 2024. 2024 19th European Microwave Integrated Circuits Conference (EuMIC). IEEE, pp. 343-346. 10.23919/eumic61603.2024.10732350

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