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Number of items: 5.

Michelarakis, Michail ORCID: https://orcid.org/0000-0003-2862-4539 2022. Investigation of surface discharges in insulation gases through synchronisation of improved electrical and fast enhanced-imaging techniques. PhD Thesis, Cardiff University.
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Michelarakis, M. ORCID: https://orcid.org/0000-0003-2862-4539, Clark, D. ORCID: https://orcid.org/0000-0002-1090-2361, Widger, P. ORCID: https://orcid.org/0000-0002-0662-8590, Beroual, A., Waters, R.T. and Haddad, A. ORCID: https://orcid.org/0000-0003-4153-6146 2022. Triple point surface discharge photography in atmospheric gases using Intensified high-speed camera system. IEEE Transactions on Dielectrics and Electrical Insulation 29 (1) , pp. 153-161. 10.1109/TDEI.2022.3148481
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Nechmi, Houssem Eddine, Michelarakis, Michail ORCID: https://orcid.org/0000-0003-2862-4539, (Manu) Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 and Wilson, Gordon 2021. Clarifications on the behavior of alternative gases to SF6 in divergent electric field distributions under AC voltage. Energies 14 (4) , 1065. 10.3390/en14041065
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Michelarakis, Michail ORCID: https://orcid.org/0000-0003-2862-4539, Lugg-Widger, Phillip ORCID: https://orcid.org/0000-0002-0662-8590, Beroual, Abderrahmane and Haddad, Abderrahmane (Manu) ORCID: https://orcid.org/0000-0003-4153-6146 2019. Electrical detection of creeping discharges over insulator surfaces in atmospheric gases under AC voltage application. Energies 12 (15) , 2970. 10.3390/en12152970
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Michelarakis, M. ORCID: https://orcid.org/0000-0003-2862-4539, Widger, P. ORCID: https://orcid.org/0000-0002-0662-8590, Haddad, A. ORCID: https://orcid.org/0000-0003-4153-6146 and Beroual, A. 2018. Creeping discharge development over insulator surfaces in natural gases: Design and implementation of test procedure. Presented at: 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), Athens, Greece, 10-13 September 2018. 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE). Piscataway, NJ: IEEE, 10.1109/ICHVE.2018.8642172

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