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Number of items: 6.

Wan, Yuwei, Liu, Ying ORCID: https://orcid.org/0000-0001-9319-5940, Chen, Zheyuan, Chen, Chong, Li, Xinyu, Hu, Fu and Packianather, Michael ORCID: https://orcid.org/0000-0002-9436-8206 2024. Making knowledge graphs work for smart manufacturing: Research topics, applications and prospects. Journal of Manufacturing Systems 76 , pp. 103-132. 10.1016/j.jmsy.2024.07.009
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Chen, Zheyuan, Wan, Yuwei, Liu, Ying ORCID: https://orcid.org/0000-0001-9319-5940 and Valera Medina, Agustin ORCID: https://orcid.org/0000-0003-1580-7133 2024. A knowledge graph-supported information fusion approach for multi-faceted conceptual modelling. Information Fusion 101 , 101985. 10.1016/j.inffus.2023.101985
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Wan, Yuwei, Chen, Zheyuan, Liu, Ying ORCID: https://orcid.org/0000-0001-9319-5940, Packianather, Michael ORCID: https://orcid.org/0000-0002-9436-8206 and Wang, Rui 2023. Constructing industrial knowledge graph through ontology and link prediction. Presented at: IEEE International Conference on Automation Science and Engineering (CASE), Auckland, New Zealand, 26-29 August 2023. 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE). IEEE, pp. 1-6. 10.1109/CASE56687.2023.10260566
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Xu, Miao, Zhu, Bo, Chen, Chunmei and Wan, Yuwei 2022. On-line recognition of abnormal patterns in bivariate autocorrelated process using random forest. Computers, Materials & Continua 73 (1) , pp. 1707-1722. 10.32604/cmc.2022.027708
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Wan, Yuwei, Chen, Zheyuan, Hu, Fu, Liu, Ying ORCID: https://orcid.org/0000-0001-9319-5940, Packianather, Michael ORCID: https://orcid.org/0000-0002-9436-8206 and Wang, Rui 2022. Exploiting knowledge graph for multi-faceted conceptual modelling using GCN. Presented at: 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2021), Linz, Austria, 17-19 November 2021. , vol.200 Procedia Computer Science, Vol 200, pp. 1174-1183. 10.1016/j.procs.2022.01.317
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Zhang, Hongshuo, Zhu, Bo, Pang, Kaimin, Chen, Chunmei and Wan, Yuwei 2021. Identification of abnormal patterns in AR (1) process using CS-SVM. Intelligent Automation and Soft Computing 28 (3) , pp. 797-810. 10.32604/iasc.2021.017232
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