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2026.
Hybrid HSQ resist-mask lithography for ultra-low line edge roughness 150 mm InP wafer scale up.
IEEE Transactions on Semiconductor Manufacturing
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Baker, J., Albeladi, F., Gillgrass, S., Qiao, D., Allford, C. P. ORCID: https://orcid.org/0000-0002-3798-9014 and Smowton, P. M. ORCID: https://orcid.org/0000-0002-9105-4842
2025.
Monolithically-integrated quantum dot optical power monitor.
Presented at: IPC 2025,
Singapore,
9-13 November 2025.
Proceedings 2025 IEEE Photonics Conference (IPC).
IEEE,
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Mishra, P., Enderson, A., Albeladi, F. T., Qiao, D., Jandu, G. M. ORCID: https://orcid.org/0009-0006-0758-9817, Jarvis, L., Gillgrass, S-J., Raitu, B. P., Peng, N., Deng, H., Tang, M., Liu, H-Y., Shutts, S. ORCID: https://orcid.org/0000-0001-6751-7790 and Smowton, P. M. ORCID: https://orcid.org/0000-0002-9105-4842
2025.
Achieving selectivity and reduced absorption for low loss monolithic InAs QD based III-V photonic integration.
Journal of Physics D: Applied Physics
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| Zhang, Yani, Wu, Kexin, Guang, Zhe, Guo, Bo, Qiao, Dun, Wei, Zhiyi, Yang, Hongyan, Wang, Qiuyang, Li, Kang, Copner, Nigel and Li, Xiaohui 2024. Advances and challenges of ultrafast fiber lasers in 2–4 µm mid‐infrared spectral regions. Laser and Photonics Reviews 18 (3) , 2300786. 10.1002/lpor.202300786 |
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Sivanathan, Sivagunalan, Roula, Mohammed Ali, Li, Kang, Qiao, Dun and Copner, Nigel Joseph
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Design of an FPGA-based high-speed data acquisition system for frequency scanning interferometry long-range measurement.
IEEE Open Journal of Instrumentation and Measurement
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